Detection, Location and Reconstruction of Multicracks by Means of a Ga-based Electromagnetic Technique

In this work, an approach for the reconstruction of both geometrical and dielectric properties of multiple defects inside a known host medium is analyzed. In particular, the GAbased integrated strategy is applied starting from the knowledge of the scattered field in an external measurement domain in order to determine positions, sizes and dielectric permittivities of the defects, as well as the related field distribution. In order to evaluate the effectiveness in both locating the defects and reconstructing the corresponding permittivity profiles, a selected set of numerical results is presented.